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Author's Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses
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relationbetweenworkfunctionandstructuralpropertiesoftriangulardefectsin4hsicepitaxiallayerkelvinprobeforcemicroscopicandspectroscopicanalyses
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Relation between work function and structural properties of triangular defects in 4H-SiC epitaxial layer: Kelvin probe force microscopic and spectroscopic analyses
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