VIAF

Virtual International Authority File

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Leader     00000nz a2200037n 45 0
001     WKP|Q63801718  (VIAF cluster)  (Authority/Source Record)
003     WKP
005     20241120235804.0
008     241120nneanz||abbn n and d
035 ‎‡a  (WKP)Q63801718‏
024 ‎‡a  0000-0001-5794-6188‏ ‎‡2  orcid‏
024 ‎‡a  55869271000‏ ‎‡2  scopus‏
035 ‎‡a  (OCoLC)Q63801718‏
100 0 ‎‡a  Robert O'Connor‏ ‎‡c  researcher ORCID 0000-0001-5794-6188‏ ‎‡9  en‏
375 ‎‡a  1‏ ‎‡2  iso5218‏
400 0 ‎‡a  Robert O'Connor‏ ‎‡c  onderzoeker‏ ‎‡9  nl‏
670 ‎‡a  Author's A Dy 2 O 3 -capped HfO 2 Dielectric and TaC x -based Metals Enabling Low-V t Single-Metal-Single-Dielectric Gate Stack‏
670 ‎‡a  Author's Anomalous positive-bias temperature instability of high-κ/metal gate nMOSFET devices with Dy 2 O 3 capping‏
670 ‎‡a  Author's Nitrogen reactive ion etch processes for the selective removal of poly-(4-vinylpyridine) in block copolymer films‏
670 ‎‡a  Author's Tuning PMOS Mo(O,N) metal gates to NMOS by addition of DyO capping layer‏
909 ‎‡a  (scopus) 55869271000‏ ‎‡9  1‏
909 ‎‡a  (orcid) 0000000157946188‏ ‎‡9  1‏
919 ‎‡a  tuningpmosmoonmetalgatestonmosbyadditionofdyocappinglayer‏ ‎‡A  Tuning PMOS Mo(O,N) metal gates to NMOS by addition of DyO capping layer‏ ‎‡9  1‏
919 ‎‡a  nitrogenreactiveionetchprocessesfortheselectiveremovalofpoly4vinylpyridineinblockcopolymerfilms‏ ‎‡A  Nitrogen reactive ion etch processes for the selective removal of poly-(4-vinylpyridine) in block copolymer films‏ ‎‡9  1‏
919 ‎‡a  anomalouspositivebiastemperatureinstabilityofhighκmetalgatenmosfetdeviceswithdy2o3capping‏ ‎‡A  Anomalous positive-bias temperature instability of high-κ/metal gate nMOSFET devices with Dy 2 O 3 capping‏ ‎‡9  1‏
919 ‎‡a  dy2o3cappedhfo2dielectricandtac10basedmetalsenablinglow5tsinglemetalsingledielectricgatestack‏ ‎‡A  A Dy 2 O 3 -capped HfO 2 Dielectric and TaC x -based Metals Enabling Low-V t Single-Metal-Single-Dielectric Gate Stack‏ ‎‡9  1‏
946 ‎‡a  b‏ ‎‡9  1‏
996 ‎‡2  BIBSYS|10023192
996 ‎‡2  BNF|17893443
996 ‎‡2  DNB|173974325
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996 ‎‡2  NUKAT|n 2007089861
996 ‎‡2  LC|n 93121818
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996 ‎‡2  N6I|vtls000013785
996 ‎‡2  N6I|vtls000080113
996 ‎‡2  NII|DA04409344
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996 ‎‡2  LC|nb2001044611
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996 ‎‡2  NUKAT|n 2012100743
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996 ‎‡2  LC|n 2013021163
996 ‎‡2  BNF|12890408
996 ‎‡2  NII|DA10377592
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996 ‎‡2  RERO|A003649564
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996 ‎‡2  RERO|A011621855
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996 ‎‡2  NTA|109660501
996 ‎‡2  NDL|001331845
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996 ‎‡2  J9U|987007451098405171
996 ‎‡2  LC|n 80148940
996 ‎‡2  NDL|00882893
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996 ‎‡2  NII|DA06574567
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996 ‎‡2  NII|DA0512590X
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996 ‎‡2  BIBSYS|90909843
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996 ‎‡2  NTA|074591827
996 ‎‡2  NUKAT|n 2006134318
996 ‎‡2  NTA|072060751
996 ‎‡2  JPG|500246421
996 ‎‡2  N6I|vtls000013747
996 ‎‡2  N6I|vtls000034218
996 ‎‡2  PLWABN|9810581946905606
996 ‎‡2  CAOONL|ncf10235899
996 ‎‡2  CAOONL|ncf11418832
996 ‎‡2  J9U|987007422014305171
996 ‎‡2  LC|n 2004108276
996 ‎‡2  NUKAT|n 2014004486
996 ‎‡2  DNB|124194737
996 ‎‡2  NTA|074519794
996 ‎‡2  ISNI|0000000439588753
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996 ‎‡2  SUDOC|114204527
996 ‎‡2  NII|DA07772384
996 ‎‡2  BNC|981059745504206706
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996 ‎‡2  BIBSYS|90603643
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996 ‎‡2  LC|n 93121577
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996 ‎‡2  N6I|vtls002410767
996 ‎‡2  NKC|ola2003193684
996 ‎‡2  LC|n 84107739
996 ‎‡2  NTA|18311454X
996 ‎‡2  LC|n 80005747
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996 ‎‡2  BIBSYS|9032802
996 ‎‡2  LC|n 79147539
996 ‎‡2  NSK|000709723
997 ‎‡a  0 0 lived 0 0‏ ‎‡9  1‏